The integration of boundary-scan test methods to a mixed-signal environment. - Adam W. Ley (ITC, 1999)

Boundary Scan: The Internet of Test. - Mike Wondolowski; Ben Bennetts; Adam W. Ley (IEEE Des. Test Comput., 1999)

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. - Bambang Suparjo; Adam W. Ley; Adam Cron; Heiko Ehrenberg (ITC, 2006)

JTAG system test in a MicroTCA world. - Bradford G. Van Treuren; Adam W. Ley (ITC, 2007)

Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. - Adam W. Ley (ITC, 2009)

Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes? - Adam W. Ley (ITC, 2009)

A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. - Alfred L. Crouch; Adam W. Ley (IEEE Instrum. Meas. Mag., 2020)