Evaluation of conductive-to-resistive layers interaction in thick-film resistors. - Krzysztof Mleczko; Zbigniew Zawislak; Adam Witold Stadler; Andrzej Kolek; Andrzej Dziedzic; Jacek Cichosz (Microelectron. Reliab., 2008)

Noise properties of thick-film resistors in extended temperature range. - Adam Witold Stadler (Microelectron. Reliab., 2011)