Reliability of next-generation field-effect transistors with transition metal dichalcogenides. - Yury Yu. Illarionov; Aday J. Molina-Mendoza; Michael Waltl; Theresia Knobloch; Marco M. Furchi; Thomas Mueller; Tibor Grasser (IRPS, 2018)

A photosensor employing data-driven binning for ultrafast image recognition. - Lukas Mennel; Aday J. Molina-Mendoza; Matthias Paur; Dmitry K. Polyushkin; Dohyun Kwak; Miriam Giparakis; Maximilian Beiser; Aaron Maxwell Andrews; Thomas Mueller (CoRR, 2021)