Failure mechanism of trench IGBT under short-circuit after turn-off. - Adel Benmansour; Stephane Azzopardi; Jean-Christophe Martin; Eric Woirgard (Microelectron. Reliab., 2006)

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions. - Adel Benmansour; Stephane Azzopardi; Jean-Christophe Martin; Eric Woirgard (Microelectron. Reliab., 2007)

A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation. - Adel Benmansour; Stephane Azzopardi; Jean-Christophe Martin; Eric Woirgard (Microelectron. Reliab., 2007)