A deep-submicrometer analog-to-digital converter using focused-ion-beam implants. - Robert H. Walden; Adele E. Schmitz; Allan R. Kramer; Lawrence E. Larson; John Pasiecznik (IEEE J. Solid State Circuits, 1990)

Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability. - Bruce M. Paine; Richard C. Wong; Adele E. Schmitz; Robert H. Walden; Loi D. Nguyen; Michael J. Delaney; Kenny C. Hum (Microelectron. Reliab., 2001)

Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process. - William J. Rowe; Bruce M. Paine; Adele E. Schmitz; Robert H. Walden; Michael J. Delaney (Microelectron. Reliab., 2003)

Coherent singlet-triplet oscillations in a silicon-based double quantum dot. - Brett M. Maune; Matthew G. Borselli; Biqin Huang; Thaddeus D. Ladd; Peter W. Deelman; Kevin S. Holabird; Andrey A. Kiselev; Ivan Alvarado-Rodriguez; Richard S. Ross; Adele E. Schmitz; Marko Sokolich; Christopher A. Watson; et al. (Nat., 2012)