Structural approach for built-in tests in RF devices. - Deepa Mannath; Dallas Webster; Victor Montaño-Martinez; David Cohen; Shai Kush; Ganesan Thiagarajan; Adesh Sontakke (ITC, 2010)

Test time reduction using parallel RF test techniques. - Rajesh Mittal; Adesh Sontakke; Rubin A. Parekhji (VTS, 2010)

DFT for extremely low cost test of mixed signal SOCs with integrated RF and power management. - Rajesh Mittal; Lakshmanan Balasubramanian; Adesh Sontakke; Harikrishna Parthasarathy; Prakash Narayanan; Puneet Sabbarwal; Rubin A. Parekhji (ITC, 2011)