A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET. - Adil Meersha; B. Sathyajit; Mayank Shrivastava (VLSID, 2017)

Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. - Nagothu Karmel Kranthi; Abhishek Mishra; Adil Meersha; Harsha B. Variar; Mayank Shrivastava (IRPS, 2018)

On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. - Nagothu Karmel Kranthi; Abhishek Mishra; Adil Meersha; Mayank Shrivastava (VLSID, 2018)

First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. - Abhishek Mishra; Adil Meersha; Nagothu Karmel Kranthi; Kruti Trivedi; Harsha B. Variar; N. S. Veenadhari Bellamkonda; Srinivasan Raghavan 002; Mayank Shrivastava (IRPS, 2019)