Analysis of performance and reliability trade-off in dummy pattern design for 32-nm technology. - Aditya P. Karmarkar; Xiaopeng Xu; Victor Moroz; Greg Rollins; Xiao Lin (ISQED, 2009)

Simulation methodology and flow integration for 3D IC stress management. - Mark Nakamoto; Riko Radojcic; Wei Zhao; Vinay K. Dasarapu; Aditya P. Karmarkar; Xiaopeng Xu (CICC, 2010)