Fault-coverage Maximizing March Tests for Memory Testing. - Feng Yun; Yunkun Lin; Lou Yunfei; Lei Gao; Vaibhav Gera; Boxuan Li; Vennela Chowdary Nekkanti; Aditya Rajendra Pharande; Kunal Sheth; Meghana Thommondru; Guizhong Ye; Sandeep Gupta 001 (ITC, 2022)