Duplicate Instance Identification In Multiview And Multiscale Systems. - Adrita Barari; Rajat Katiyar; Payanshi Jain; Juhi Srivastava; N. V. S. Abhilash; Ankit Sati; Chirag Jain; Ghulam Mohiuddin Khan (BigMM, 2020)

AlphaRA: An AlphaZero based approach to Redundancy Analysis. - Helik Kanti Thacker; Atishay Kumar; Adrita Barari; Damini; Ankit Gupta 010; Keerthi Kiran Jagannathachar; Deokgu Yoon (ICMLA, 2021)

A scalable solution to AlphaZero based Redundancy Analysis for semiconductor chips. - Helik Kanti Thacker; Sairam Jujjarapu; Adrita Barari; Damini; Paulami Das; Sudhanshu Gupta 003; Akhilesh Sudhir Patankar; Keerthi Kiran Jagannathachar; Deokgu Yoon (ICMLA, 2022)

Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering. - Ankit Gupta 010; Adrita Barari; Damini; Keerthi Kiran Jagannathachar; Seungwoo Lee; Janghoon Oh; Jungha Kim; Min-Joo Kim (VLSID, 2022)