Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. - Laurent Artola; Ahmad Al Youssef; Samuel Ducret; Franck Perrier; Raphael Buiron; Olivier Gilard; Julien Mekki; Mathieu Boutillier; Guillaume Hubert; Christian Poivey (Sensors, 2018)