Defects in Microelectronic Materials and Devices, Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf (Eds.). Taylor and Francis Group LLC, Boca Raton, FL, USA. - Ahmed Amin (Microelectron. Reliab., 2009)

Deep Learning-Based Correlation Analysis of Public Transit and Ride-Sharing: A Study of Urban Mobility Patterns in Paris. - Mohamed Nassar 004; Ahmed Amin; Reem Hussin; Mahmoud Essa; Mohanned Mahmoud; Abdelrhman Ahmed; Noha Gamal El-Din Saad (ICCA, 2024)

Spectral-based estimation of chlorophyll content and determination of background interference mechanisms in low-coverage rice. - Yanyu Chen 003; Xiaochan Wang; Xiaolei Zhang; Xin Xu; Xuekai Huang; Dezhi Wang; Ahmed Amin (Comput. Electron. Agric., 2024)