A semi-analytical method for VaR and credit exposure analysis. - Ben De Prisco; Ian Iscoe; Alexander Y. Kreinin; Ahmed Nagi (Ann. Oper. Res., 2007)

Calibration of the default probability model. - Alexander Y. Kreinin; Ahmed Nagi (Eur. J. Oper. Res., 2008)

Regression methods for prediction of PECVD Silicon Nitride layer thickness. - Hendrik Purwins; Ahmed Nagi; Bernd Barak; Uwe Hockele; Andreas Kyek; Benjamin Lenz; Gunter Pfeifer; Kurt Weinzierl (CASE, 2011)