Testing current mode two-input logic gates. - S. H. Amer; Ahmed S. Emara; R. Mohie El-Din; M. M. Fouad; Ahmed H. Madian; Hassanein H. Amer; Mohamed B. Abdelhalim; H. H. Draz 001 (CCECE, 2014)

Memristor-based Center-Of-Gravity (COG) defuzzifier circuit. - S. H. Amer; Ahmed H. Madian; Ahmed S. Emara (ECCTD, 2015)

Design and analysis of memristor-based min-max circuit. - S. H. Amer; Ahmed H. Madian; Ahmed S. Emara (ICECS, 2015)

High coverage test for the second generation current conveyor. - Ahmed S. Emara; Ahmed H. Madian; Hassanein H. Amer; S. H. Amer (ICECS, 2015)

Testing of memristor ratioed logic (MRL) XOR gate. - Ahmed S. Emara; Ahmed H. Madian; Hassanein H. Amer; S. H. Amer; Mohamed B. Abdelhalim (ICM, 2016)

Effect of open faults in FPGA switch matrices on fault detection mechanisms. - Manar N. Shaker; Ahmed H. Madian; Mohamed B. Abdelhalim; Sherif H. Amer; Ahmed S. Emara; Hassanein H. Amer (ICM, 2016)

Evaluation of multi-level buck converters for low-power applications. - Abdullah Abdulslam; S. H. Amer; Ahmed S. Emara; Yehea Ismail (ISCAS, 2016)

On the Design of DACs for Dynamic Calibration Applications using Periodic Sequences from ΣΔ Modulators. - Ahmed S. Emara; Gordon W. Roberts; Sadok Aouini; Mahdi Parvizi; Naim Ben-Hamida (CCECE, 2019)

Selecting the Fastest Settling-Time Filter in PDM-based DACs used for Dynamic Calibration Applications. - Ahmed S. Emara; Gordon W. Roberts; Sadok Aouini; Mahdi Parvizi; Naim Ben-Hamida (MWSCAS, 2019)

Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters. - Ahmed S. Emara; Gordon W. Roberts; Sadok Aouini; Mahdi Parvizi; Naim Ben-Hamida (NEWCAS, 2020)

Optimized Periodic ΣΔ Bitstreams for DC Signal Generation Used in Dynamic Calibration Applications. - Ahmed S. Emara; Denis Romanov; Gordon W. Roberts; Sadok Aouini; Mahdi Parvizi; Naim Ben-Hamida (IEEE Open J. Circuits Syst., 2020)

An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications. - Ahmed S. Emara; Denis Romanov; Gordon W. Roberts; Sadok Aouini; Soheyl Ziabakhsh; Mahdi Parvizi; Naim Ben-Hamida (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Error Detection and Masking Circuit with High Diagnosability for Redundant Sensors. - Beatrice Shokry; Hassanein H. Amer; Ramez M. Daoud; Mahmoud Rumman; Ahmed S. Emara (MECO, 2023)

Slew-Rate Analysis of Scalable Multi-Stage CMOS Operational Transconductance Amplifiers. - Mahmood A. Mohammed; Ahmed S. Emara; Gordon W. Roberts (MWSCAS, 2024)