A Behavioral Fault Simulator For Ideal. - Ajay Khoche; Sunil D. Sherlekar; G. Venkatesh 001 (VLSI Design, 1992)

A Behavioral Fault Simulator for Ideal. - Ajay Khoche; Sunil D. Sherlekar; G. Venkatesh 001; Raja Venkateswaran (IEEE Des. Test Comput., 1992)

Testing micropipelines. - Ajay Khoche; Erik Brunvand (ASYNC, 1994)

Testing self-timed circuits using partial scan. - Ajay Khoche; Erik Brunvand (ASYNC, 1995)

DFT for fast testing of self-timed control circuits. - Sandeep Pagey; Ajay Khoche; Erik Brunvand (Asian Test Symposium, 1995)

A partial scan methodology for testing self-timed circuits. - Ajay Khoche; Erik Brunvand (VTS, 1995)

ACT: A DFT Tool for Self-Timed Circuits. - Ajay Khoche; Erik Brunvand (ITC, 1997)

Critical hazard free test generation for asynchronous circuits. - Ajay Khoche; Erik Brunvand (VTS, 1997)

A new methodology for improved tester utilization. - Ajay Khoche; Rohit Kapur; David Armstrong; Thomas W. Williams; Mick Tegethoff; Jochen Rivoir (ITC, 2001)

Tackling test trade-offs from design, manufacturing to market using economic modeling. - Erik H. Volkerink; Ajay Khoche; Linda A. Kamas; Jochen Rivoir; Hans G. Kerkhoff (ITC, 2001)

Packet-Based Input Test Data Compression Techniques. - Erik H. Volkerink; Ajay Khoche; Subhasish Mitra (ITC, 2002)

Test Vector Compression Using EDA-ATE Synergies. - Ajay Khoche; Erik H. Volkerink; Jochen Rivoir; Subhasish Mitra (VTS, 2002)

Test Economics for Multi-site Test with Modern Cost Reduction Techniques. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (VTS, 2002)

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (J. Electron. Test., 2003)

The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. - Andreas Leininger; Ajay Khoche; Martin Fischer 002; Nagesh Tamarapalli; Wu-Tung Cheng; Randy Klingenberg; Wu Yang (ATS, 2006)

Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. - Ajay Khoche; Domenico Chindamo; Michael Braun; Martin Fischer 002 (ITC, 2006)

Session Abstract. - Ajay Khoche (VTS, 2006)

Session Abstract. - Ajay Khoche; Peter Muhmenthaler (VTS, 2006)

Session Abstract. - Ajay Khoche; Mike Rodgers; Pete O'Neil (VTS, 2006)

Panel Summaries: Real-Time Volume Diagnostics–Requirements and Challenges. - Ajay Khoche (IEEE Des. Test Comput., 2006)

A Tutorial on STDF Fail Datalog Standard. - Ajay Khoche; Phil Burlison; John Rowe; Glenn Plowman (ITC, 2008)

STDF Memory Fail Datalog Standard. - Ajay Khoche; Jay Katz; Sauro Landini; Kochen Liao; Neetu Agrawal; Glenn Plowman; Songlin Zuo; Liyang Lai; John Rowe; Thomas Zanon (VTS, 2009)

STIL P1450.4: A standard for test flow specification. - Jim O'Reilly; Ajay Khoche; Ernst Wahl; Bruce R. Parnas (ITC, 2010)

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. - Alfred L. Crouch; John C. Potter; Ajay Khoche; Jennifer Dworak (IEEE Des. Test, 2013)