Study of workload impact on BTI HCI induced aging of digital circuits. - Ajith Sivadasan; Florian Cacho; Sidi Ahmed Benhassain; Vincent Huard; Lorena Anghel (DATE, 2016)

Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. - Ajith Sivadasan; Florian Cacho; Sidi Ahmed Benhassain; Vincent Huard; Lorena Anghel (ERMAVSS@DATE, 2016)

Activity profiling: Review of different solutions to develop reliable and performant design. - Florian Cacho; Ahmed Benhassain; Souhir Mhira; Ajith Sivadasan; Vincent Huard; P. Cathelin; Vincent Knopik; Abhishek Jain 003; C. R. Parthasarathy; Lorena Anghel (IOLTS, 2016)

Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. - Lorena Anghel; Ahmed Benhassain; Ajith Sivadasan; Florian Cacho; Vincent Huard (VTS, 2016)

Workload dependent reliability timing analysis flow. - Ajith Sivadasan; Armelle Notin; Vincent Huard; Etienne Maurin; Souhir Mhira; Florian Cacho; Lorena Anghel (DATE, 2017)

NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. - Ajith Sivadasan; Riddhi Jitendrakumar Shah; Vincent Huard; Florian Cacho; Lorena Anghel (DATE, 2018)