Resonant Wavelength Variation Modelling for Microring Resonators based on Fabrication Deviation Analysis. - Tsuyoshi Horikawa; Daisuke Shimura; Hiroyuki Takahashi; Jun Ushida; Yohei Sobu; Akemi Shiina; Masatoshi Tokushima; Seok-Hwan Jeong; Keizo Kinoshita; Tohru Mogami (ECOC, 2017)

A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation in Silicon Waveguides. - Tsuyoshi Horikawa; Hideaki Okayama; Yosuke Onawa; Daisuke Shimura; Jun Ushida; Akemi Shiina; Tadashi Murao; Hiroki Yaegashi (ECOC, 2020)