Real-time failure imaging system under power stress for power semiconductors using Scanning Acoustic Tomography (SAT). - Akihiko Watanabe; Ichiro Omura (Microelectron. Reliab., 2012)

Real time degradation monitoring system for high power IGBT module under power cycling test. - Akihiko Watanabe; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2013)

Suppressing Bearing Voltage in an Inverter-Fed Ungrounded Brushless DC Motor. - Tatsuo Maetani; Yoshinori Isomura; Akihiko Watanabe; Kenichi Iimori; Shigeo Morimoto (IEEE Trans. Ind. Electron., 2013)

Generating Personalized Snippets for Web Page Recommender Systems. - Akihiko Watanabe; Ryohei Sasano; Hiroya Takamura; Manabu Okumura (WI-IAT (1), 2014)

Failure analysis of power devices based on real-time monitoring. - Akihiko Watanabe; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2015)

Learning from Numerous Untailored Summaries. - Yuta Kikuchi; Akihiko Watanabe; Ryohei Sasano; Hiroya Takamura; Manabu Okumura (PRICAI, 2016)

Learning to Generate Market Comments from Stock Prices. - Soichiro Murakami; Akihiko Watanabe; Akira Miyazawa; Keiichi Goshima; Toshihiko Yanase; Hiroya Takamura; Yusuke Miyao (ACL (1), 2017)

Real-time imaging of temperature distribution inside a power device under a power cycling test. - Akihiko Watanabe; R. Nagao; Ichiro Omura (Microelectron. Reliab., 2017)

A power cycling degradation inspector of power semiconductor devices. - Akihiko Watanabe; Ichiro Omura (Microelectron. Reliab., 2018)