Measurement-Based Ring Oscillator Variation Analysis. - Koh Johguchi; Akihiro Kaya; Shinya Izumi; Hans Jürgen Mattausch; Tetsushi Koide; Norio Sadachika (IEEE Des. Test Comput., 2010)

Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. - Norio Sadachika; Shu Mimura; Akihiro Yumisaki; Koh Johguchi; Akihiro Kaya; Mitiko Miura-Mattausch; Hans Jürgen Mattausch (IEICE Trans. Electron., 2011)