Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. - Norio Sadachika; Shu Mimura; Akihiro Yumisaki; Koh Johguchi; Akihiro Kaya; Mitiko Miura-Mattausch; Hans Jürgen Mattausch (IEICE Trans. Electron., 2011)