Modeling heterogeneous SoCs with SystemC: a digital/MEMS case study. - Ankush Varma; Muhammad Yaqub Afridi; Akin Akturk; Paul Klein; Allen R. Hefner; Bruce L. Jacob (CASES, 2006)

Nonlinear behavior of electrostatic discharge protection structures under high-power microwave excitation: Modeling and simulation. - Zeynep Dilli; Akin Akturk; Neil Goldsman; Michael A. Holloway; John C. Rodgers (ISCAS, 2011)

The effects of radiation on the terrestrial operation of SiC MOSFETs. - Akin Akturk; James McGarrity; Neil Goldsman; Daniel J. Lichtenwalner; Brett Hull; Dave Grider; Richard Wilkins (IRPS, 2018)

Reliability studies of SiC vertical power MOSFETs. - Daniel J. Lichtenwalner; Brett Hull; Edward Van Brunt; Shadi Sabri; Donald A. Gajewski; Dave Grider; Scott Allen; John W. Palmour; Akin Akturk; James McGarrity (IRPS, 2018)

Reliability Testing of SiC MOS Devices at 500°C. - Ayayi C. Ahyi; Sarit Dhar; Zeynep Dilli; Akin Akturk; Neil Goldsman; A. Ghanbari (IRPS, 2019)

Investigation of Terrestrial Neutron Induced Failure Rates in Silicon Carbide JFET Based Cascode FETs. - L. Fursin; P. Losee; Akin Akturk (IRPS, 2022)

Cryogenic Modeling for Open-Source Process Design Kit Technology. - Akin Akturk; Ayushman Tripathi; Mehdi Saligane (BCICTS, 2023)