Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. - Akinobu Teramoto; H. Umeda; K. Azamawari; Kiyoteru Kobayashi; K. Shiga; J. Komori; Y. Ohno; A. Shigetomi (Microelectron. Reliab., 2001)

Circuit level prediction of device performance degradation due to negative bias temperature stress. - Rihito Kuroda; Akinobu Teramoto; Kazufumi Watanabe; Michihiko Mifuji; Takahisa Yamaha; Shigetoshi Sugawa; Tadahiro Ohmi (Microelectron. Reliab., 2007)

High quality gate insulator film formation on SiC using by microwave-excited high-density plasma. - Koutarou Tanaka; Hiroaki Tanaka; Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi (Microelectron. Reliab., 2007)

Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction. - Kazufumi Watanabe; Akinobu Teramoto; Rihito Kuroda; Shigetoshi Sugawa; Tadahiro Ohmi (Microelectron. Reliab., 2007)

Accurate negative bias temperature instability lifetime prediction based on hole injection. - Akinobu Teramoto; Rihito Kuroda; Shigetoshi Sugawa; Tadahiro Ohmi (Microelectron. Reliab., 2008)

Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces. - Masahiro Konda; Akinobu Teramoto; Tomoyuki Suwa; Rihito Kuroda; Tadahiro Ohmi (IEICE Trans. Electron., 2009)

The role of the temperature on the scattering mechanisms limiting the electron mobility in metal-oxide-semiconductor field-effect-transistors fabricated on (110) silicon-oriented wafers. - Philippe Gaubert; Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi (ESSDERC, 2012)

A statistical evaluation of low frequency noise of in-pixel source follower-equivalent transistors with various channel types and body bias. - Rihito Kuroda; A. Yonezawa; Akinobu Teramoto; T. L. Li; Yasuhisa Tochigi; Shigetoshi Sugawa (Sensors, Cameras, and Systems for Industrial and Scientific Applications, 2013)

High-speed and highly accurate evaluation of electrical characteristics in MOSFETs. - Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi (ICICDT, 2013)

A statistical evaluation of effective time constants of random telegraph noise with various operation timings of in-pixel source follower transistors. - A. Yonezawa; Rihito Kuroda; Akinobu Teramoto; T. Obara; Shigetoshi Sugawa (IMSE, 2014)

An Electrical Impedance Biosensor Array for Tracking Moving Cells. - Norichika Ogata; Akihisa Shina; Takayuki Komiya; Yoji Iizuka; Ken Matsuse; Fuminobu Imaizumi; Tomoyuki Suwa; Akinobu Teramoto (IEEE SENSORS, 2018)

Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation. - Akinobu Teramoto; Keiichi Hashimoto; Tomoyuki Suwa; Jun-ichi Tsuchimoto; Marie Hayashi; Hyeonwoo Park; Shigetoshi Sugawa (IRPS, 2018)

Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. - Ryo Akimoto; Rihito Kuroda; Akinobu Teramoto; Takezo Mawaki; Shinya Ichino; Tomoyuki Suwa; Shigetoshi Sugawa (IRPS, 2020)