Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions. - Chenyue Ma; Hans Jürgen Mattausch; Masataka Miyake; Takahiro Iizuka; Kazuya Matsuzawa; Seiichiro Yamaguchi; Teruhiko Hoshida; Akinori Kinoshita; Takahiko Arakawa; Jin He 003; Mitiko Miura-Mattausch (IEICE Trans. Electron., 2013)