The Advanced Test System Architecture Provides Fast and Accurate Test for a High Resolution ADC. - Akinori Maeda (ITC, 1992)

How the noise floor affects the production yield. - Akinori Maeda (ATS, 2007)

Low Distortion Sine Waveform Generation by an AWG. - Akinori Maeda (ATS, 2008)

A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG. - Akinori Maeda (ITC, 2008)

Actual implementation of multi domain test: Further reduction of cost of test. - Yasuhiro Takahashi; Akinori Maeda; Mitsuhiro Ogura (ITC, 2011)

Multi Domain Test: Novel test strategy to reduce the Cost of Test. - Yasuhiro Takahashi; Akinori Maeda (VTS, 2011)