Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. - Hiroyuki Nakamura; Akio Shirokane; Yoshihito Nishizaki; Anis Uzzaman; Vivek Chickermane; Brion L. Keller; Tsutomu Ube; Yoshihiko Terauchi (Asian Test Symposium, 2005)