Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays. - Carmine Miccoli; Giovanni M. Paolucci; Christian Monzio Compagnoni; Alessandro S. Spinelli; Akira Goda (IRPS, 2015)

Reviewing the Evolution of the NAND Flash Technology. - Christian Monzio Compagnoni; Akira Goda; Alessandro S. Spinelli; Peter Feeley; Andrea L. Lacaita; Angelo Visconti (Proc. IEEE, 2017)

Non-volatile Memory Application to Quantum Error Correction with Non-uniformly Quantized CiM. - Yuya Ichikawa; Akira Goda; Chihiro Matsui; Ken Takeuchi (IMW, 2022)

Stochastic Computing-based Computation-in-Memory (SC CiM) Architecture for DNNs and Hierarchical Evaluations of Non-volatile Memory Error and Defect Tolerance. - Takuto Nishimura; Yuya Ichikawa; Akira Goda; Naoko Misawa; Chihiro Matsui; Ken Takeuchi (IMW, 2023)

Reliability of 3D NAND Flash for Future Storage Systems (Invited). - Akira Goda; Kishore Kumar Muchherla; Peter Feeley (IRPS, 2023)