Seed Ordering and Selection for High Quality Delay Test. - Tomokazu Yoneda; Michiko Inoue; Akira Taketani; Hideo Fujiwara (Asian Test Symposium, 2010)

Test pattern selection to optimize delay test quality with a limited size of test set. - Michiko Inoue; Akira Taketani; Tomokazu Yoneda; Hiroshi Iwata; Hideo Fujiwara (ETS, 2010)

Test Pattern Ordering and Selection for High Quality Test Set under Constraints. - Michiko Inoue; Akira Taketani; Tomokazu Yoneda; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2012)