Noise analysis using on-chip waveform monitor in bandgap voltage references. - Akitaka Murata; Shuji Agatsuma; Daisaku Ikoma; Kouji Ichikawa; Takahiro Tsuda; Makoto Nagata; Kumpei Yoshikawa; Yuuki Araga; Yuji Harada (EMC Compo, 2013)