On the volatility of oxide defects: Activation, deactivation, and transformation. - Tibor Grasser; M. Wahl; Wolfgang Goes; Yannick Wimmer; Al-Moatasem El-Sayed; Alexander L. Shluger; Ben Kaczer (IRPS, 2015)

Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films. - David Z. Gao; Jack Strand; Al-Moatasem El-Sayed; Alexander L. Shluger; Andrea Padovani; Luca Larcher (IRPS, 2018)

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence. - Wolfgang Goes; Yannick Wimmer; Al-Moatasem El-Sayed; Gerhard Rzepa; Markus Jech; Alexander L. Shluger; Tibor Grasser (Microelectron. Reliab., 2018)

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. - Alexander Makarov; Dimitri Linten; Stanislav Tyaginov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Markus Jech; Tibor Grasser (ESSDERC, 2019)

Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. - Alexander Makarov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Alexander Grill; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Tibor Grasser; Dimitri Linten; Stanislav Tyaginov (IRPS, 2019)

Subband Structure and Ballistic Conductance of a Molybdenum Disulfide Nanoribbon in Topological 1T' Phase: A k·p Study. - Viktor Sverdlov; Al-Moatasem Bellah El-Sayed; Siegfried Selberherr (MIXDES, 2020)

Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface. - Lukas Cvitkovich; Markus Jech; Dominic Waldhör; Al-Moatasem El-Sayed; Christoph Wilhelmer; Tibor Grasser (ESSDERC, 2021)

Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide. - Diego Milardovich; Markus Jech; Dominic Waldhoer; Al-Moatasem Bellah El-Sayed; Tibor Grasser (ESSDERC, 2021)

Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network. - Christoph Wilhelmer; Markus Jech; Dominic Waldhoer; Al-Moatasem Bellah El-Sayed; Lukas Cvitkovich; Tibor Grasser (ESSDERC, 2021)

Mitigating switching variability in carbon nanotube memristors. - James Farmer; William Whitehead; Andrew Hall; Dmitry Veksler; Gennadi Bersuker; David Z. Gao; Al-Moatasem El-Sayed; Thomas Durrant; Alexander L. Shluger; Thomas Rueckes; Lee Cleveland; Harry Luan; et al. (IRPS, 2021)

Silicon-Impurity Defects in Calcium Fluoride: A First Principles Study. - Dominic Waldhoer; Bibhas Manna; Al-Moatasem Bellah El-Sayed; Theresia Knobloch; Yury Illarionov; Tibor Grasser (ESSDERC, 2022)

Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities. - Christoph Wilhelmer; Dominic Waldhoer; Markus Jech; Al-Moatasem Bellah El-Sayed; Lukas Cvitkovich; Michael Waltl; Tibor Grasser (ESSDERC, 2022)

Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics. - James Farmer; Dmitry Veksler; E. Tang; Gennadi Bersuker; David Z. Gao; Al-Moatasem El-Sayed; Thomas Durrant; Alexander L. Shluger; Thomas Rueckes; Lee Cleveland; Harry Luan; Rahul Sen (IRPS, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IRPS, 2022)