Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (Microelectron. Reliab., 2015)

A New Method for the Characterization of Electronic Components Immunity. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (IEEE Trans. Instrum. Meas., 2015)