Near-field EMC study to improve electronic component reliability. - Geneviève Duchamp; D. Castagnet; Alain Meresse (Microelectron. Reliab., 2007)

Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. - Jean-Baptiste Gros; Geneviève Duchamp; Alain Meresse; Jean-Luc Levant (Microelectron. Reliab., 2009)