High precision comparison between SNS and SIS Josephson voltage standards. - Blaise Jeanneret; Alain Rüfenacht; Charles J. Burroughs Jr. (IEEE Trans. Instrum. Meas., 2001)

Optimization of QHE-devices for metrological applications. - Beat Jeckelmann; Alain Rüfenacht; Blaise Jeanneret; Frédéric Overney; Klaus Pierz; Aurel von Campenhausen; Günter Hein (IEEE Trans. Instrum. Meas., 2001)

Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards. - Charles J. Burroughs Jr.; Alain Rüfenacht; Samuel P. Benz; Paul D. Dresselhaus; Bryan C. Waltrip; Thomas L. Nelson (IEEE Trans. Instrum. Meas., 2008)

Progress Toward a 1 V Pulse-Driven AC Josephson Voltage Standard. - Samuel P. Benz; Paul D. Dresselhaus; Alain Rüfenacht; Norman F. Bergren; Joseph R. Kinard; Regis Pinheiro Landim (IEEE Trans. Instrum. Meas., 2009)

Systematic Error Analysis of Stepwise-Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards. - Charles J. Burroughs Jr.; Alain Rüfenacht; Samuel P. Benz; Paul D. Dresselhaus (IEEE Trans. Instrum. Meas., 2009)

Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability. - Blaise Jeanneret; Frédéric Overney; Luca Callegaro; Alessandro Mortara; Alain Rüfenacht (IEEE Trans. Instrum. Meas., 2009)

Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard. - Alain Rüfenacht; Charles J. Burroughs Jr.; Samuel P. Benz; Paul D. Dresselhaus; Bryan C. Waltrip; Thomas L. Nelson (IEEE Trans. Instrum. Meas., 2009)

AC Power Standard Using a Programmable Josephson Voltage Standard. - Bryan C. Waltrip; Bo Gong; Thomas L. Nelson; Yicheng Wang; Charles J. Burroughs Jr.; Alain Rüfenacht; Samuel P. Benz; Paul D. Dresselhaus (IEEE Trans. Instrum. Meas., 2009)

Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard. - Blaise Jeanneret; Frédéric Overney; Alain Rüfenacht; Jaani Nissilä (IEEE Trans. Instrum. Meas., 2010)

NIST 10 V Programmable Josephson Voltage Standard System. - Charles J. Burroughs Jr.; Paul D. Dresselhaus; Alain Rüfenacht; David Olaya; Michael M. Elsbury; Yi-Hua Tang; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2011)

Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard. - Frédéric Overney; Alain Rüfenacht; Jean-Pierre Braun; Blaise Jeanneret; Paul S. Wright (IEEE Trans. Instrum. Meas., 2011)

Thermal-Transfer Standard Validation of the Josephson-Voltage-Standard-Locked Sine-Wave Synthesizer. - Alain Rüfenacht; Frédéric Overney; Alessandro Mortara; Blaise Jeanneret (IEEE Trans. Instrum. Meas., 2011)

Method for Ensuring Accurate AC Waveforms With Programmable Josephson Voltage Standards. - Charles J. Burroughs Jr.; Alain Rüfenacht; Samuel P. Benz; Paul D. Dresselhaus (IEEE Trans. Instrum. Meas., 2013)

Differential Sampling Measurement of a 7 V RMS Sine Wave With a Programmable Josephson Voltage Standard. - Alain Rüfenacht; Charles J. Burroughs Jr.; Paul D. Dresselhaus; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2013)

Cryocooled 10 V Programmable Josephson Voltage Standard. - Alain Rüfenacht; Logan A. Howe; Anna E. Fox; Robert E. Schwall; Paul D. Dresselhaus; Charles J. Burroughs Jr.; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2015)

Application of a 10 V Programmable Josephson Voltage Standard in Direct Comparison With Conventional Josephson Voltage Standards. - Yi-Hua Tang; James Wachter; Alain Rüfenacht; Gerald J. FitzPatrick; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2015)

Impact of Leakage Currents on Voltage Accuracy in the Josephson Arbitrary Waveform Synthesizer. - Raegan L. Johnson-Wilke; Jesús M. Mejía; Alain Rüfenacht; Anna E. Fox; Nathan E. Flowers-Jacobs; Paul D. Dresselhaus; Frédéric Overney; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2025)

Dual-Frequency-Bias Programmable Josephson Voltage Standard Circuit. - Alain Rüfenacht; Anna E. Fox; Raegan L. Johnson-Wilke; Benjamin T. Scheck; Paul D. Dresselhaus; Samuel P. Benz (IEEE Trans. Instrum. Meas., 2025)