Optical and Electrical Testing of Latchup in I/O Interface Circuits. - Franco Stellari; Peilin Song; Moyra K. McManus; Robert Gauthier 002; Alan J. Weger; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda (ITC, 2003)

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. - Romain Desplats; A. Eral; Felix Beaudoin; Philippe Perdu; Alan J. Weger; Moyra K. McManus; Peilin Song; Franco Stellari (Microelectron. Reliab., 2003)

Latchup Analysis Using Emission Microscopy. - Franco Stellari; Peilin Song; Moyra K. McManus; Alan J. Weger; Robert Gauthier 002; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda; Philip Wu; Steven C. Wilson (Microelectron. Reliab., 2003)

CMOS IC diagnostics using the luminescence of OFF-state leakage currents. - Stas Polonsky; Keith A. Jenkins; Alan J. Weger; Shinho Cho (ITC, 2004)

A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. - Peilin Song; Franco Stellari; Alan J. Weger; Tian Xia (ITC, 2004)

An advanced optical diagnostic technique of IBM z990 eServer microprocessor. - Peilin Song; Franco Stellari; Bill Huott; Otto Wagner; Uma Srinivasan 002; Yuen H. Chan; Rick Rizzolo; H. J. Nam; James P. Eckhardt; Timothy G. McNamara; Ching-Lung Tong; Alan J. Weger; et al. (ITC, 2005)

Photon emission microscopy of inter/intra chip device performance variations. - Stas Polonsky; M. Bhushan; A. Gattiker; Alan J. Weger; Peilin Song (Microelectron. Reliab., 2005)

Power Distribution Measurements of the Dual Core PowerPCTM 970MP Microprocessor. - Hendrik F. Hamann; Alan J. Weger; James A. Lacey; Erwin B. Cohen; Craig Atherton (ISSCC, 2006)

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. - Franco Stellari; Peilin Song; Tim Diemoz; Alan J. Weger; Tami Vogel; Steven C. Wilson; John Pennings; Richard F. Rizzolo (ITC, 2006)

Thermal-aware task scheduling at the system software level. - Jeonghwan Choi; Chen-Yong Cher; Hubertus Franke; Hendrik F. Hamann; Alan J. Weger; Pradip Bose (ISLPED, 2007)

Temperature-limited microprocessors: Measurements and design implications. - Hendrik F. Hamann; Alan J. Weger; James A. Lacey; Zhigang Hu; Pradip Bose; Erwin B. Cohen; Jamil A. Wakil (VLSI Design, 2007)

Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements. - Hendrik F. Hamann; Alan J. Weger; James A. Lacey; Zhigang Hu; Pradip Bose; Erwin B. Cohen; Jamil A. Wakil (IEEE J. Solid State Circuits, 2007)

Keeping hot chips cool: are IC thermal problems hot air? - Ruchir Puri; Devadas Varma; Darvin Edwards; Alan J. Weger; Paul D. Franzon; Andrew Yang; Stephen V. Kosonocky (DAC, 2008)

Power-efficient, reliable microprocessor architectures: modeling and design methods. - Pradip Bose; Alper Buyuktosunoglu; Chen-Yong Cher; John A. Darringer; Meeta Sharma Gupta; Hendrik F. Hamann; Hans M. Jacobson; Prabhakar Kudva; Eren Kursun; Niti Madan; Indira Nair; Jude A. Rivers; et al. (ACM Great Lakes Symposium on VLSI, 2010)

Early chip planning cockpit. - Jeonghee Shin; John A. Darringer; Guojie Luo; Alan J. Weger; Charles L. Johnson (DATE, 2011)

MARVEL - Malicious alteration recognition and verification by emission of light. - Peilin Song; Franco Stellari; Dirk Pfeiffer; Jim Culp; Alan J. Weger; Alyssa Bonnoit; Bob Wisnieff; Marc Taubenblatt (HOST, 2011)

Power management of multi-core chips: Challenges and pitfalls. - Pradip Bose; Alper Buyuktosunoglu; John A. Darringer; Meeta Sharma Gupta; Michael B. Healy; Hans M. Jacobson; Indira Nair; Jude A. Rivers; Jeonghee Shin; Augusto Vega; Alan J. Weger (DATE, 2012)

Verification of untrusted chips using trusted layout and emission measurements. - Franco Stellari; Peilin Song; Alan J. Weger; Jim Culp; A. Herbert; Dirk Pfeiffer (HOST, 2014)

Counterfeit IC detection using light emission. - Peilin Song; Franco Stellari; Alan J. Weger (ITC, 2014)

Analyzing path delays for accelerated testing of logic chips. - Emily Ray; Barry P. Linder; Raphael Robertazzi; Kevin Stawiasz; Alan J. Weger; Emmanuel Yashchin; James H. Stathis; Peilin Song (IRPS, 2015)

Time-integrated photon emission as a function of temperature in 32 nm CMOS. - Andrea Bahgat Shehata; Alan J. Weger; Franco Stellari; Peilin Song; Hervé Deslandes; Ted R. Lundquist; Euan Ramsay (IRPS, 2015)

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. - Franco Stellari; Keith A. Jenkins; Alan J. Weger; Barry P. Linder; Peilin Song (IRPS, 2015)

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. - Franco Stellari; Alan J. Weger; Keith A. Jenkins; Giuseppe La Rosa; Barry P. Linder; Peilin Song (IRPS, 2018)