A General Purpose IDDQ Measurement Circuit. - Kenneth M. Wallquist; Alan W. Righter; Charles F. Hawkins (ITC, 1993)

Defect Classes - An Overdue Paradigm for CMOS IC. - Charles F. Hawkins; Jerry M. Soden; Alan W. Righter; F. Joel Ferguson (ITC, 1994)

Solving Known Good Die (and Substrate) Test Issues. - Alan W. Righter (ITC, 1995)

High Resolution IDDQ Characterization and Testing - Practical Issues. - Alan W. Righter; Jerry M. Soden; Richard W. Beegle (ITC, 1996)

iDD Pulse Response Testing Applied to Complex CMOS ICs. - J. S. Beasley; S. Pour-Mozafari; D. Huggett; Alan W. Righter; C. J. Apodaca (ITC, 1997)

CMOS IC reliability indicators and burn-in economics. - Alan W. Righter; Charles F. Hawkins; Jerry M. Soden; Peter C. Maxwell (ITC, 1998)

Real-world printed circuit board ESD failures. - Andrew Olney; Brad Gifford; John Guravage; Alan W. Righter (Microelectron. Reliab., 2005)

Investigation on effectiveness of series gate resistor in CDM ESD protection designs. - Yuanzhong Paul Zhou; Alan W. Righter; Jean-Jacques Hajjar (ASICON, 2013)