Quality assurance in memory built-in self-test tools. - Albert Au; Artur Pogiel; Janusz Rajski; Piotr Sydow; Jerzy Tyszer; Justyna Zawada (DDECS, 2014)

Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. - Venkat Yellapragada; Suresh Raman; Banadappa Shivaray; Luc Romain; Benoit Nadeau-Dostie; Martin Keim; Jean-Francois Cote; Albert Au; Giri Podichetty; Ashok Anbalan (ITC-Asia, 2018)

Power-Aware Test Scheduling for Memory BIST. - Albert Au; Michal Kçpinski; Makary Orczyk; Artur Pogiel (ITC, 2024)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)

Periodic Non-Destructive Memory BIST for Automotive Applications. - Wei Zou; Artur Pogiel; Albert Au; Martin Keim (VTS, 2025)