Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses. - Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2009)

Shape-shifting digital hardware concept: Towards a new adaptive computing system. - Carmen G. Almudéver; Antonio Rubio 001; Javier Martín-Martínez; Albert Crespo-Yepes; Rosana Rodríguez; Montserrat Nafría (AHS, 2012)

Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications. - Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2013)

A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture. - Javier Martín-Martínez; Carmen G. Almudéver; Albert Crespo-Yepes; Rosana Rodríguez; Montserrat Nafría; Antonio Rubio 001 (Microelectron. Reliab., 2014)

SPICE Compact Modeling of Bipolar/Unipolar Memristor Switching Governed by Electrical Thresholds. - Fernando García-Redondo; Robert P. Gowers; Albert Crespo-Yepes; Marisa López-Vallejo; Liudi Jiang (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. - Xavier Aragonès; Diego Mateo; Enrique Barajas; Albert Crespo-Yepes; Rosana Rodríguez; Javier Martín-Martínez; Montserrat Nafría (ISCAS, 2019)

Experimental Verification of Memristor-Based Material Implication NAND Operation. - Marcos Maestro-Izquierdo; Javier Martín-Martínez; Albert Crespo-Yepes; Manel Escudero; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Antonio Rubio 001 (IEEE Trans. Emerg. Top. Comput., 2019)

Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. - Rosana Rodríguez; Albert Crespo-Yepes; Javier Martín-Martínez; Montserrat Nafría; Xavier Aragonès; Diego Mateo; Enrique Barajas (IRPS, 2020)

Power-Efficient Noise-Induced Reduction of ReRAM Cell's Temporal Variability Effects. - Vasileios G. Ntinas; Antonio Rubio 001; Georgios Ch. Sirakoulis; Emili Salvador Aguilera; Marta Pedro; Albert Crespo-Yepes; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría (IEEE Trans. Circuits Syst. II Express Briefs, 2021)

Beneficial Role of Noise in Hf-based Memristors. - Rosana Rodríguez; Javier Martín-Martínez; Emili Salvador Aguilera; Albert Crespo-Yepes; Enrique Miranda 002; Montserrat Nafría; Antonio Rubio 001; Vasileios G. Ntinas; Georgios Ch. Sirakoulis (ISCAS, 2022)