Diagnose compound scan chain and system logic defects. - Yu Huang 005; Wu-Tung Cheng; Ruifeng Guo; Will Hsu; Yuan-Shih Chen; Albert Mann (ITC, 2007)

Faster defect localization in nanometer technology based on defective cell diagnosis. - Manish Sharma; Wu-Tung Cheng; Ting-Pu Tai; Y. S. Cheng; Will Hsu; Chen Liu; Sudhakar M. Reddy; Albert Mann (ITC, 2007)

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. - Manish Sharma; Brady Benware; Lei Ling; David Abercrombie; Lincoln Lee; Martin Keim; Huaxing Tang; Wu-Tung Cheng; Ting-Pu Tai; Yi-Jung Chang; Reinhart Lin; Albert Mann (ITC, 2008)