Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. - Alberto Castellazzi; R. Kraus; Norbert Seliger; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2002)

Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. - Alberto Castellazzi; V. Kartal; R. Kraus; Norbert Seliger; Martin Honsberg-Riedl; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2003)

Analysis of PowerMOSFET chips failed in thermal instability. - Alberto Castellazzi; H. Schwarzbauer; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2004)

Thermal characterisation of power devices during transient operation. - Alberto Castellazzi; Martin Honsberg-Riedl; Gerhard K. M. Wachutka (Microelectron. J., 2006)

New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. - Davide Barlini; Mauro Ciappa; Alberto Castellazzi; Michel Mermet-Guyennet; Wolfgang Fichtner (Microelectron. Reliab., 2006)

Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. - Alberto Castellazzi; Mauro Ciappa; Wolfgang Fichtner; G. Lourdel; Michel Mermet-Guyennet (Microelectron. Reliab., 2006)

A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. - Alberto Castellazzi; Mauro Ciappa; Wolfgang Fichtner; M. Piton; Michel Mermet-Guyennet (Microelectron. Reliab., 2007)

Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. - X. Perpiñà; Alberto Castellazzi; M. Piton; Michel Mermet-Guyennet; José Millán (Microelectron. Reliab., 2007)

Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. - Pierre Solomalala; J. Saiz; Michel Mermet-Guyennet; Alberto Castellazzi; Mauro Ciappa; X. Chauffleur; Jean-Pierre Fradin (Microelectron. Reliab., 2007)

Robustness test and failure analysis of IGBT modules during turn-off. - Jesús Urresti-Ibañez; Alberto Castellazzi; M. Piton; José Rebollo; Michel Mermet-Guyennet; Mauro Ciappa (Microelectron. Reliab., 2007)

Novel simulation approach for transient analysis and reliable thermal management of power devices. - Alberto Castellazzi; Mauro Ciappa (Microelectron. Reliab., 2008)

Reliability considerations in pulsed power resonant conversion. - Fabio Carastro; Alberto Castellazzi; Jon C. Clare; M. C. Johnson; Michael J. Bland; Patrick W. Wheeler (Microelectron. Reliab., 2009)

Control technique for power device electro-thermal stress minimisation in non-linear load variable-frequency resonant power converters. - Fabio Carastro; Alberto Castellazzi; Jon C. Clare; Patrick Wheeler 001 (Microelectron. Reliab., 2010)

Dynamic active cooling for improved power system reliability. - Alberto Castellazzi; Wei Juin Choy; Pericle Zanchetta (Microelectron. Reliab., 2011)

A study of SiC Power BJT performance and robustness. - Alberto Castellazzi; T. Takuno; Ryutaro Onishi; Tsuyoshi Funaki; Tsunenobu Kimoto; Takashi Hikihara (Microelectron. Reliab., 2011)

Design and test of a high power IGBT non-destructive tester. - Ashraf Ahmed; Alberto Castellazzi; L. Coulbeck; M. C. Johnson (ISIE, 2012)

Circuit design and experimental test of a high power IGBT non-destructive tester. - Ashraf Ahmed; Alberto Castellazzi; L. Coulbeck; M. C. Johnson (Microelectron. Reliab., 2012)

A closed-loop IGBT non-destructive tester. - Ashraf Ahmed; Yasaman Shadrokh; Lee Coulbeck; Alberto Castellazzi; C. Mark Johnson (Microelectron. Reliab., 2012)

Thermal instability effects in SiC Power MOSFETs. - Alberto Castellazzi; Tsuyoshi Funaki; Tsunenobu Kimoto; Takashi Hikihara (Microelectron. Reliab., 2012)

Repetitive high peak current pulsed discharge film-capacitor reliability testing. - H. Q. S. Dang; Martin R. Corfield; Alberto Castellazzi; C. Mark Johnson; Patrick Wheeler 001 (Microelectron. Reliab., 2012)

Performance evaluation of normaly-off SiC JFET in matrix converter without antiparrallel diodes. - Saeed Safari; Alberto Castellazzi; Pat Wheeler (IECON, 2013)

Experimental analysis of electro-thermal instability in SiC Power MOSFETs. - Michele Riccio; Alberto Castellazzi; Giuseppe De Falco; Andrea Irace (Microelectron. Reliab., 2013)

High temperature gate-bias and reverse-bias tests on SiC MOSFETs. - Li Yang; Alberto Castellazzi (Microelectron. Reliab., 2013)

Full-order observer based IGBT temperature online estimation. - Xiang Wang; Alberto Castellazzi; Pericle Zanchetta (IECON, 2014)

Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs. - Asad Fayyaz; Li Yang; Michele Riccio; Alberto Castellazzi; Andrea Irace (Microelectron. Reliab., 2014)

Robust snubberless soft-switching power converter using SiC power MOSFETs and bespoke thermal design. - Francesco Giuliani; De Dipankar; Nicola Delmonte; Alberto Castellazzi; Paolo Cova (Microelectron. Reliab., 2014)

Overload robust IGBT design for SSCB application. - Ihsan Supono; Jesús Urresti; Alberto Castellazzi; David Flores (Microelectron. Reliab., 2014)

GaN-based consumer application DC-DC converter for PCB embedment technology integration. - Antonio D. Martínez-Pérez; Adane Kassa Solomon; Alberto Castellazzi; Bing Lu (IECON, 2015)

High temperature pulsed-gate robustness testing of SiC power MOSFETs. - Asad Fayyaz; Alberto Castellazzi (Microelectron. Reliab., 2015)

Novel multilevel hybrid inverter topology with power scalability. - Emre Gurpinar; Alberto Castellazzi (IECON, 2016)

SiC power MOSFETs performance, robustness and technology maturity. - Alberto Castellazzi; Asad Fayyaz; Gianpaolo Romano; Li Yang; Michele Riccio; Andrea Irace (Microelectron. Reliab., 2016)

Thermal design optimization of novel modular power converter assembly enabling higher performance, reliability and availability. - Paolo Cova; Nicola Delmonte; Adane Kassa Solomon; Alberto Castellazzi (Microelectron. Reliab., 2016)

Body diode reliability investigation of SiC power MOSFETs. - Asad Fayyaz; Gianpaolo Romano; Alberto Castellazzi (Microelectron. Reliab., 2016)

Development and characterisation of pressed packaging solutions for high-temperature high-reliability SiC power modules. - Jose Angel Ortiz Gonzalez; Attahir Murtala Aliyu; Olayiwola Alatise; Alberto Castellazzi; Li Ran; Phil Mawby (Microelectron. Reliab., 2016)

Observer based dynamic adaptive cooling system for power modules. - Xiang Wang; Alberto Castellazzi; Pericle Zanchetta (Microelectron. Reliab., 2016)

Measuring structure functions of power devices in inverters. - Attahir Murtala Aliyu; Alberto Castellazzi (Microelectron. Reliab., 2017)

Thermal design and characterization of a modular integrated liquid cooled 1200 V-35 A SiC MOSFET bi-directional switch. - Paolo Cova; Attahir Murtala Aliyu; Alberto Castellazzi; Diego Chiozzi; Nicola Delmonte; Philippe Lasserre; N. Pignoloni (Microelectron. Reliab., 2017)

Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. - Thorsten Oeder; Alberto Castellazzi; Martin Pfost (Microelectron. Reliab., 2017)

Evaluation of SiC Schottky Diodes Using Pressure Contacts. - Jose Angel Ortiz Gonzalez; Olayiwola Alatise; Attahir Murtala Aliyu; Pushparajah Rajaguru; Alberto Castellazzi; Li Ran; Philip Mawby; Chris Bailey 001 (IEEE Trans. Ind. Electron., 2017)

Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. - Alberto Castellazzi; Asad Fayyaz; Siwei Zhu; Thorsten Oeder; Martin Pfost (IRPS, 2018)

GaN transistors efficient cooling by graphene foam. - Mattia Antonini; Paolo Cova; Nicola Delmonte; Alberto Castellazzi (Microelectron. Reliab., 2018)

VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs. - Besar Asllani; Asad Fayyaz; Alberto Castellazzi; Hervé Morel; Dominique Planson (Microelectron. Reliab., 2018)

Avalanche ruggedness of parallel SiC power MOSFETs. - Asad Fayyaz; Besar Asllani; Alberto Castellazzi; Michele Riccio; Andrea Irace (Microelectron. Reliab., 2018)

Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables. - Pushparajah Rajaguru; H. Lu; Chris Bailey 001; Alberto Castellazzi; V. Pathirana; N. Udugampola; Florin Udrea (Microelectron. Reliab., 2018)

Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules. - Fausto Stella; Olufisayo Olanrewaju; Zineng Yang; Alberto Castellazzi; Gianmario Pellegrino (Microelectron. Reliab., 2018)

VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate. - Besar Asllani; Alberto Castellazzi; Oriol Avino-Salvado; Asad Fayyaz; Hervé Morel; Dominique Planson (IRPS, 2019)

Defect Detection in Double-Sided Cooled Power Modules by Structure Functions. - Ciro Scognamillo; Antonio Pio Catalano; Vincenzo d'Alessandro; Lorenzo Codecasa; Alberto Castellazzi (PRIME, 2022)

Enhancing Electrical Ruggedness in Double-Sided Cooled Power Modules. - Ciro Scognamillo; Antonio Pio Catalano; Lorenzo Codecasa; Alberto Castellazzi; Vincenzo d'Alessandro (PRIME, 2024)