Analysis of Cu-wire pull and shear test failure modes under ageing cycles and finite element modelling of Si-crack propagation. - Stefano Mazzei; Mauro Madia; Stefano Beretta 002; Alberto Mancaleoni; Sebastiano Aparo (Microelectron. Reliab., 2014)

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. - Riccardo Enrici Vaion; Matteo Medda; Alberto Mancaleoni; Giovanna Mura; A. Pintus; M. De Tomasi (Microelectron. Reliab., 2017)