Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. - Antoine Reverdy; M. Marchetti; Allesandra Fudoli; Alberto Pagani; V. Goubier; M. Cason; Jesse Alton; Martin Igarashi; G. Gibbons (Microelectron. Reliab., 2014)

Thermal issues in test: An overview of the significant aspects and industrial practice. - Juergen Alt; Paolo Bernardi; Alberto Bosio; Riccardo Cantoro; Hans G. Kerkhoff; Andreas Leininger; Wolfgang Molzer; Alessandro Motta; Christian Pacha; Alberto Pagani; Alireza Rohani; R. Strasser (VTS, 2016)

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. - Davide Appello; Paolo Bernardi; G. Giacopelli; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; C. Rabbi; Marco Restifo; P. Ruberg; Ernesto Sánchez 001; C. M. Villa; Federico Venini (DATE, 2017)

Main Parasitic Effects in Contactless Wafer Testing. - Alessandro Finocchiaro; Giovanni Girlando; Alessandro Motta; Alberto Pagani; Giuseppe Palmisano (ApplePies, 2018)

A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna. - Alessandro Finocchiaro; Giovanni Girlando; Alessandro Motta; Alberto Pagani; Giuseppe Palmisano (DTIS, 2018)

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Andrea Colazzo; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; Marco Restifo; Ernesto Sánchez 001; Federico Venini (J. Low Power Electron., 2018)

Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. - Alessandro Finocchiaro; Giovanni Girlando; Alessandro Motta; Alberto Pagani; Egidio Ragonese; Giuseppe Palmisano (IEEE Trans. Circuits Syst. II Express Briefs, 2018)

New R&R Methodology in Semiconductor Manufacturing Electrical Testing. - Lorella Bordogna; Fabio Brembilla; Alberto Pagani; Marco Spinetta (ITC, 2022)