Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates. - Alberto Rodriguez-Fernandez; M. B. González; Francesca Campabadal; Jordi Suñé; Enrique Miranda 002 (Microelectron. Reliab., 2015)

Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis. - Alberto Rodriguez-Fernandez; Carlo Cagli; Luca Perniola; Jordi Suñé; Enrique Miranda 002 (Microelectron. Reliab., 2017)

A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. - Alberto Rodriguez-Fernandez; J. Muñoz-Gorriz; Jordi Suñé; Enrique Miranda 002 (Microelectron. Reliab., 2018)