A new technique for thermal resistance measurement in power electron devices. - Fabio Filicori; Paola Rinaldi; Giorgio Vannini; Alberto Santarelli (IEEE Trans. Instrum. Meas., 2005)

Automated microwave-device characterization setup based on a technology-independent generalized bias system. - Pier Andrea Traverso; Antonio Raffo; Massimo Pirazzini; Alberto Santarelli; Fabio Filicori (IEEE Trans. Instrum. Meas., 2006)

An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. - Antonio Raffo; Valeria Di Giacomo; Pier Andrea Traverso; Alberto Santarelli; Giorgio Vannini (IEEE Trans. Instrum. Meas., 2009)

A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices. - Antonio Raffo; Valeria Vadalà; Pier Andrea Traverso; Alberto Santarelli; Giorgio Vannini; Fabio Filicori (Comput. Stand. Interfaces, 2011)

An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices. - Corrado Florian; Pier Andrea Traverso; Alberto Santarelli; Fabio Filicori (IEEE Trans. Instrum. Meas., 2013)

M2S parameters: a Multi-Tone Multi-Harmonic Measurement Approach for the Characterization of Nonlinear Networks. - Gian Piero Gibiino; Alberto Maria Angelotti; Alberto Santarelli; Fabio Filicori; Pier Andrea Traverso (I2MTC, 2020)

Multitone Multiharmonic Scattering Parameters for the Characterization of Nonlinear Networks. - Gian Piero Gibiino; Alberto Maria Angelotti; Alberto Santarelli; Fabio Filicori; Pier Andrea Traverso (IEEE Trans. Instrum. Meas., 2021)

Broadband Measurement of Error Vector Magnitude for Microwave Vector Signal Generators Using a Vector Network Analyzer. - Alberto Maria Angelotti; Gian Piero Gibiino; Alberto Santarelli; Pier Andrea Traverso (IEEE Trans. Instrum. Meas., 2022)