Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. - Alejandro Sendón; Stéphane Dauzère-Pérès; Jacques Pinaton (WSC, 2015)

Optimizing capacity assignment of multiple identical metrology tools. - Stéphane Dauzère-Pérès; Michael Hassoun; Alejandro Sendón (WSC, 2016)

A Lagrangian heuristic for minimising risk using multiple heterogeneous metrology tools. - Stéphane Dauzère-Pérès; Michael Hassoun; Alejandro Sendón (Int. J. Prod. Res., 2020)