Methodology of automation process of wafer tests. - Aleksandra Krzyzanowska; Piotr Maj; Pawel Grybos; Robert Szczygiel; Anna Koziol (MIXDES, 2015)

Algorithms for elimination of charge sharing effects in single photon counting pixel detectors. - Piotr Otfinowski; Aleksandra Krzyzanowska (MIXDES, 2017)

Multithreshold Pattern Recognition Algorithm for Charge Sharing Compensation in Hybrid Pixel Detectors. - Piotr Otfinowski; Aleksandra Krzyzanowska; Pawel Grybos; Robert Szczygiel (MIXDES, 2018)

Hybrid Detector with Interpixel Communication for Color X-ray Imaging. - Pawel Grybos; Rafal Kleczek; Piotr Kmon; Aleksandra Krzyzanowska; Piotr Otfinowski; Robert Szczygiel; Miroslaw Zoladz (ICECS, 2021)