High Accuracy Stimulus Generation for A/D Converter BIST. - Aubin Roy; Stephen K. Sunter; Alessandra Fudoli; Davide Appello (ITC, 2002)

A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (MTDT, 2002)

A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field. - Alessandra Fudoli; Alberto Ascagni; Davide Appello; Hans A. R. Manhaeve (ETW, 2003)

Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. - Davide Appello; Paolo Bernardi; Alessandra Fudoli; Maurizio Rebaudengo; Matteo Sonza Reorda; Vincenzo Tancorre; Massimo Violante (ITC, 2003)

Yield Analysis of Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Emil Gizdarski; Ben Mathew; Vincenzo Tancorre (VTS, 2004)

Understanding Yield Losses in Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Vincenzo Tancorre; Emil Gizdarski; Ben Mathew (IEEE Des. Test Comput., 2004)

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. - Davide Appello; Alessandra Fudoli; Vincenzo Tancorre; Paolo Bernardi; Fulvio Corno; Maurizio Rebaudengo; Matteo Sonza Reorda (J. Electron. Test., 2004)