Electrical Resistance Tomography on thin films: Sharp conductive profiles. - Alessandro Cultrera; Luca Callegaro (RTSI, 2015)

A simple algorithm to find the L-curve corner in the regularization of inverse problems. - Alessandro Cultrera; Luca Callegaro (CoRR, 2016)

Electrical Resistance Tomography of Conductive Thin Films. - Alessandro Cultrera; Luca Callegaro (IEEE Trans. Instrum. Meas., 2016)

Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications. - Pasquale Arpaia; Luca Callegaro; Alessandro Cultrera; Antonio Esposito 002; Massimo Ortolano (MetroInd4.0&IoT, 2021)

Metrological Characterization of Consumer-Grade Equipment for Wearable Brain-Computer Interfaces and Extended Reality. - Pasquale Arpaia; Luca Callegaro; Alessandro Cultrera; Antonio Esposito 002; Massimo Ortolano (IEEE Trans. Instrum. Meas., 2022)

Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters. - Alessandro Cultrera; Danilo Serazio; Flavio Galliana; Bruno Trinchera; Giulia Aprile; Martino Chirulli; Luca Callegaro (I2MTC, 2024)

Electrical Resistance Tomography for the investigation of memristive nanowire networks. - Alessandro Cultrera; Gianluca Milano; Carlo Ricciardi; Luca Callegaro (I2MTC, 2025)

Calibration of mutual inductance standards with a fully-digital impedance bridge. - Juan Medved; Alessandro Cultrera; Martina Marzano; Vincenzo D'Elia; Massimo Ortolano; Luca Callegaro (I2MTC, 2025)

Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response. - Alessandro Cultrera; Juan Medved; Paolo Durandetto; Massimo Ortolano; Andrea Sosso; Luca Callegaro (IEEE Trans. Instrum. Meas., 2025)