40-mm2 3-V-only 50-MHz 64-Mb 2-b/cell CHE NOR flash memory. - Giovanni Campardo; Rino Micheloni; Stefano Commodaro; Emilio Yero; Matteo Zammattio; Sabina Mognoni; Andrea Sacco; Massimiliano Picca; Alessandro Manstretta; Marco Scotti; Ilaria Motta; C. Golla; et al. (IEEE J. Solid State Circuits, 2000)

Automated characterization of TAS-MRAM test arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Jérémy Alvarez-Herault; Ken Mackay (DTIS, 2015)

RRAM Reliability/Performance Characterization through Array Architectures Investigations. - Cristian Zambelli; Alessandro Grossi; Piero Olivo; Christian Walczyk; Christian Wenger (ISVLSI, 2015)

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Jérémy Alvarez-Herault; Ken Mackay (NVMTS, 2015)

Reliability of 3D NAND Flash Memories. - Alessandro Grossi; Cristian Zambelli; Piero Olivo (3D Flash Memories, 2016)

Bioinspired Programming of Resistive Memory Devices for Implementing Spiking Neural Networks. - Elisa Vianello; Thilo Werner; Alessandro Grossi; Etienne Nowak; Barbara De Salvo; Luca Perniola; Olivier Bichler; Blaise Yvert (ACM Great Lakes Symposium on VLSI, 2017)

Role of synaptic variability in spike-based neuromorphic circuits with unsupervised learning. - Denys R. B. Ly; Alessandro Grossi; Thilo Werner; Thomas Dalgaty; Claire Fenouillet-Béranger; Elisa Vianello; Etienne Nowak (ISCAS, 2018)

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Christian Wenger; Jérémy Alvarez-Herault; Ken Mackay (IEEE Trans. Emerg. Top. Comput., 2018)

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM. - Alessandro Grossi; Elisa Vianello; Cristian Zambelli; Pablo Royer; Jean-Philippe Noel; Bastien Giraud; Luca Perniola; Piero Olivo; Etienne Nowak (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing. - Mamathamba Kalishettyhalli Mahadevaiah; Eduardo Pérez; Christian Wenger; Alessandro Grossi; Cristian Zambelli; Piero Olivo; Finn Zahari; Hermann Kohlstedt; Martin Ziegler 004 (IRPS, 2019)

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. - Alessandro Grossi; Matteo Coppetta; Stefano Aresu; Andreas Kux; Thomas Kern; Robert Strenz (IMW, 2023)

A graph-based algorithm for NVM address decoders testing. - Pierre Scaramuzza; Thomas Kern; Matteo Coppetta; Alessandro Grossi; Rudolf Ullmann (ITC, 2024)