Impact of gate-leakage currents on CMOS circuit performance. - Alessandro Marras; Ilaria De Munari; Davide Vescovi; Paolo Ciampolini (Microelectron. Reliab., 2005)

Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests. - Alessandro Marras; Maurizio Impronta; Ilaria De Munari; M. G. Valentini; Andrea Scorzoni (Microelectron. Reliab., 2007)

A low noise high dynamic range analog front-end ASIC for the AGIPD XFEL detector. - Xintian Shi; Roberto Dinapoli; Dominic Greiffenberg; Beat Henrich; Aldo Mozzanica; Bernd Schmitt; Hans Krüger; Heinz Graafsma; Alexander Klyuev; Alessandro Marras; Ulrich Trunk (ICECS, 2012)

Vertically integrated circuits: Example of an application to an x-ray detector. - Alessandro Marras; Aschkan Allahgholi; Julian Becker; L. Bianco; Annette Delfs; Peter Goettlicher; Alexander Klyuev; S. Jack; Sabine Lange; Igor Sheviakov; Ulrich Trunk; Qingqing Xia; et al. (ICECS, 2014)

P2M: A 2MPixel CMOS Image Sensor for Soft X-Ray Detection. - Iain Sedgwick; F. Krivan; I. Shevyakov; Manfred Zimmer; Heinz Graafsma; Giuseppe Cautero; Dario Giuressi; R. Menk; G. Pinaroli; Luigi Stebel; A. Greer; Nicola Carlo Guerrini; et al. (ICECS, 2019)