An Ensembled Anomaly Detector for Wafer Fault Detection. - Giuseppe Furnari; Francesco Vattiato; Dario Allegra; Filippo Luigi Maria Milotta; Alessandro Orofino; Rosetta Rizzo; Rosaria Angela De Palo; Filippo Stanco (Sensors, 2021)

GenAI or not GenAI ? Comparing AI methodologies to solve Defect Wafer Map Classification Problem Consciousness (short paper). - Carla Battiato; Francesco Lanza; Filippo L. M. Milotta; Alessandro Orofino; Rosetta Rizzo (AIxPAC@AI*IA, 2024)