Analyzing SEU Effects in SRAM-based FPGAs. - Massimo Violante; M. Ceschia; Matteo Sonza Reorda; Alessandro Paccagnella; Paolo Bernardi; Maurizio Rebaudengo; D. Bortolato; M. Bellato; P. Zambolin; A. Candelori (IOLTS, 2003)

Ionising radiation effects on MOSFET drain current. - S. Cimino; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2003)

Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. - M. Bellato; Paolo Bernardi; D. Bortolato; A. Candelori; M. Ceschia; Alessandro Paccagnella; Maurizio Rebaudengo; Matteo Sonza Reorda; Massimo Violante; P. Zambolin (DATE, 2004)

Soft Errors induced by single heavy ions in Floating Gate memory arrays. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (DFT, 2005)

Heavy Ion Effects on Configuration Logic of Virtex FPGAs. - Monica Alderighi; A. Candelori; Fabio Casini; Sergio D'Angelo; Marcello Mancini; Alessandro Paccagnella; Sandro Pastore; Giacomo R. Sechi (IOLTS, 2005)

Erratic Effects of Irradiation in Floating Gate Memory Cells. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (IOLTS, 2006)

Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. - Francesca Danesin; Franco Zanon; Simone Gerardin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Alessandro Paccagnella (Microelectron. Reliab., 2006)

Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. - Simone Gerardin; Alessio Griffoni; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2006)

Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. - Andrea Manuzzato; Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Luca Sterpone; Massimo Violante (DFT, 2007)

Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. - Marta Bagatin; Giorgio Cellere; Simone Gerardin; Alessandro Paccagnella; Angelo Visconti; Silvia Beltrami; M. Maccarrone (IOLTS, 2007)

Ionising radiation and electrical stress on nanocrystal memory cell array. - Andrea Cester; A. Gasperin; Nicola Wrachien; Alessandro Paccagnella; Valentina Ancarani; Cosimo Gerardi (Microelectron. Reliab., 2007)

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. - Javier Martín-Martínez; Simone Gerardin; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich; Andrea Cester; Alessandro Paccagnella; G. Ghidini (Microelectron. Reliab., 2007)

On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. - Niccolò Battezzati; Simone Gerardin; Andrea Manuzzato; Alessandro Paccagnella; Sana Rezgui; Luca Sterpone; Massimo Violante (IOLTS, 2008)

Evaluating Alpha-induced soft errors in embedded microprocessors. - Paolo Rech; Simone Gerardin; Alessandro Paccagnella; Paolo Bernardi; Michelangelo Grosso; Matteo Sonza Reorda; Davide Appello (IOLTS, 2009)

DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. - Davide Appello; Paolo Bernardi; Simone Gerardin; Michelangelo Grosso; Alessandro Paccagnella; Paolo Rech; Matteo Sonza Reorda (VTS, 2009)

Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. - Paolo Rech; Michelangelo Grosso; Fabio Melchiori; Domenico Loparco; Davide Appello; Luigi Dilillo; Alessandro Paccagnella; Matteo Sonza Reorda (IOLTS, 2010)

Destructive events in NAND Flash memories irradiated with heavy ions. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Giorgio Cellere; F. Irom; D. N. Nguyen (Microelectron. Reliab., 2010)

Impact of total dose on heavy-ion upsets in floating gate arrays. - Simone Gerardin; Marta Bagatin; Alessandro Paccagnella; G. Cellere; Angelo Visconti; Mauro Bonanomi (Microelectron. Reliab., 2010)

Impact of Aging Phenomena on Soft Error Susceptibility. - Daniele Rossi 001; Martin Omaña 001; Cecilia Metra; Alessandro Paccagnella (DFT, 2011)

Low-cost Enzyme-based Biosensor for Lactic Acid Amperometric Detection - Electrical Modeling and Validation for Clinical and Food Processing Applications. - Matteo Scaramuzza; Alberto Ferrario; Elisabetta Pasqualotto; Giulio Rosati; Alessandro De Toni; Marco Quarta; Alessandro Paccagnella; Carlo Reggiani (BIODEVICES, 2012)

High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. - Cristiana Bolchini; Antonio Miele; Chiara Sandionigi; Marco Ottavi; Salvatore Pontarelli; Adelio Salsano; Cecilia Metra; Martin Omaña 001; Daniele Rossi 001; Matteo Sonza Reorda; Luca Sterpone; Massimo Violante; et al. (DFT, 2012)

Temperature dependence of neutron-induced soft errors in SRAMs. - Marta Bagatin; Simone Gerardin; Alessandro Paccagnella; Carla Andreani; Giuseppe Gorini; Christopher D. Frost (Microelectron. Reliab., 2012)

Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. - Isabella Rossetto; Fabiana Rampazzo; Simone Gerardin; Matteo Meneghini; Marta Bagatin; Alberto Zanandrea; Alessandro Paccagnella; Gaudenzio Meneghesso; Enrico Zanoni; Christian Dua; Marie-Antoinette di Forte-Poisson; Raphael Aubry; et al. (ESSDERC, 2014)

Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity. - Giovanni Bruni; Paolo Rech; Lucas A. Tambara; Gabriel L. Nazar; Fernanda Gusmão de Lima Kastensmidt; Ricardo Reis 001; Alessandro Paccagnella (VLSI-SoC, 2014)

A subthreshold, low-power, RHBD reference circuit, for earth observation and communication satellites. - Charalambos M. Andreou; Alessandro Paccagnella; Diego González Castaño; Faustino Gómez Rodríguez; Valentino Liberali; Alexander V. Prokofiev; Cristiano Calligaro; Arto Javanainen; Ari Virtanen; Daniel Nahmad; Julius Georgiou (ISCAS, 2015)

CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. - N. Demaria; G. Dellacasa; G. Mazza; Angelo Rivetti; Manuel D. Da Rocha Rolo; E. Monteil; L. Pacher; Fabio Ciciriello; Francesco Corsi; Cristoforo Marzocca; G. De Roberts; F. Loddo; et al. (IWASI, 2015)

Palladium on Plastic Substrates for Plasmonic Devices. - Paola Zuppella; Elisabetta Pasqualotto; Sara Zuccon; Francesca Gerlin; Alain Jody Corso; Matteo Scaramuzza; Alessandro De Toni; Alessandro Paccagnella; Maria Guglielmina Pelizzo (Sensors, 2015)

Impact of Bias Temperature Instability on Soft Error Susceptibility. - Daniele Rossi 001; Martin Omaña 001; Cecilia Metra; Alessandro Paccagnella (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Optimization of Cyclic Voltammetric Curve Parameters to Measure Lactate Concentration in Urine Samples. - Giulio Rosati; Matteo Scaramuzza; Elisabetta Pasqualotto; Alessandro De Toni; Alessandro Paccagnella (Sensors, 2016)

1GigaRad TID impact on 28 nm HEP analog circuits. - Federica Resta; Simone Gerardin; S. Mattiazzo; Alessandro Paccagnella; Marcello De Matteis; Christian C. Enz; Andrea Baschirotto (Integr., 2018)

A simple and accessible inkjet platform for ultra-short concept-to-prototype sEMG electrodes production. - Giulia Cisotto; Giulio Rosati; Alessandro Paccagnella (EMBC, 2019)

Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples. - Stefano Bonaldo; Lara Franchin; Erica Cretaio; Elisabetta Pasqualotto; Matteo Scaramuzza; Alessandro Paccagnella (SENSORS, 2023)

Multiphysics simulations of screen-printed electrodes for electrochemical biosensing. - Stefano Bonaldo; Sarah Tonello; Lara Franchin; Arben Merkoçi; Giulio Rosati; Alessandro Paccagnella (MetroInd4.0&IoT, 2023)

SPECTRA: A Novel Compact System for Surface Plasmon Resonance Measurements. - Elisabetta Pasqualotto; Erica Cretaio; Lara Franchin; Alessandro De Toni; Alessandro Paccagnella; Stefano Bonaldo; Matteo Scaramuzza (Sensors, 2023)

Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications. - Sarah Tonello; Tiziano Fapanni; Stefano Bonaldo; Giada Giorgi; Claudio Narduzzi; Alessandro Paccagnella; Mauro Serpelloni; Emilio Sardini; Sandro Carrara (IEEE Trans. Instrum. Meas., 2023)

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments. - Saulo G. Alberton; Alexis C. Vilas Bôas; Jeffery Wyss; Vitor A. P. Aguiar; Matheus S. Pereira; Luca Silvestrin; Serena Mattiazzo; Alessandro Paccagnella; Carlo Cazzaniga; Maria Kastriotou; Christopher D. Frost; Nilberto H. Medina (IEEE Access, 2025)